In-Situ Diagnostics and Prognostics of Solder Fatigue in IGBT Modules for Electric Vehicle Drives
Bing Ji
X. Song
W. Cao
V. Pickert
Y. HU
J. Mackersie
G. Pierce
2381/37115
https://figshare.le.ac.uk/articles/journal_contribution/In-Situ_Diagnostics_and_Prognostics_of_Solder_Fatigue_in_IGBT_Modules_for_Electric_Vehicle_Drives/10149431
This paper proposes an in situ diagnostic and prognostic (D&P) technology to monitor the health condition of insulated gate bipolar transistors (IGBTs) used in EVs with a focus on the IGBTs' solder layer fatigue. IGBTs' thermal impedance and the junction temperature can be used as health indicators for through-life condition monitoring (CM) where the terminal characteristics are measured and the devices' internal temperature-sensitive parameters are employed as temperature sensors to estimate the junction temperature. An auxiliary power supply unit, which can be converted from the battery's 12-V dc supply, provides power to the in situ test circuits and CM data can be stored in the on-board data-logger for further offline analysis. The proposed method is experimentally validated on the developed test circuitry and also compared with finite-element thermoelectrical simulation. The test results from thermal cycling are also compared with acoustic microscope and thermal images. The developed circuitry is proved to be effective to detect solder fatigue while each IGBT in the converter can be examined sequentially during red-light stopping or services. The D&P circuitry can utilize existing on-board hardware and be embedded in the IGBT's gate drive unit.
2016-04-04 08:39:51
condition monitoring
electric drives
electric vehicles
fatigue
fault diagnosis
insulated gate bipolar transistors
modules
reliability
solders
temperature sensors
CM data
D&P technology
IGBT gate drive unit
IGBT modules
IGBT solder layer fatigue
IGBT thermal impedance
acoustic microscope images
auxiliary power supply unit
device internal temperature-sensitive parameters
electric vehicle drives
finite-element thermoelectrical simulation
health condition monitoring
in situ diagnostic and prognostic technology
in situ test circuits
junction temperature
offline analysis
on-board data-logger
on-board hardware
terminal characteristics
test circuitry
thermal cycling
thermal images
voltage 12 V
Current measurement
Fatigue
Heating
Impedance
Insulated gate bipolar transistors
Semiconductor device measurement
Temperature measurement
Electric vehicles (EVs)
insulated gate bipolar transistors (IGBTs)
prognostics and health management
thermal variable measurement