%0 Journal Article %A Howes, Paul Bedford %A Rhead, S. %A Roy, Mervyn %A Nicklin, C.L. %A Rawle, J.L. %A Norris, C.A. %D 2013 %T Silicon Σ13 501 grain boundary interface structure determined by bicrystal Bragg rod x-ray scattering %U https://figshare.le.ac.uk/articles/journal_contribution/Silicon_13_501_grain_boundary_interface_structure_determined_by_bicrystal_Bragg_rod_x-ray_scattering/10168610 %2 https://figshare.le.ac.uk/ndownloader/files/18325727 %K IR content %X The atomic structure of the silicon Σ13(501) symmetric tilt grain boundary interface has been determined using Bragg rod x-ray scattering. In contrast to conventional structural studies of grain boundary structure using transmission electron microscopy this approach allows the non-destructive measurement of macroscopic samples. The interface was found to have a single structure that is fully four-fold coordinated. X-ray diffraction data were measured at Beamline I07 at the Diamond Light Source. %I University of Leicester