10.25392/leicester.data.11825652.v1
Basil Eljuse
Basil
Eljuse
Search-based Stress-test Framework for IC Testing
University of Leicester
2020
sbst
spea2
random-restart hill climbing
hill climbing
simulated annealing
integrated circuits
stress testing
2020-02-11 09:08:59
Software
https://figshare.le.ac.uk/articles/software/Search-based_Stress-test_Framework_for_IC_Testing/11825652
<div>This is a test framework that implements search-based software test approach for auto generating tests that stress-testing deeply embedded components like Arm CCI (Cache Coherent Interconnect) in an Integrated Circuit.</div><div><br></div><div>This test framework is used as part of the research which investigates the suitability of search-based approaches in IC testing. <br></div><div><br></div><div>This test framework is used as part of empirical studies conducted using Arm hardware platforms that includes CCI component. It employs search algorithms to derive the test cases that would maximally stress test the CCI component from system level. These empirical studies explored the suitability of a range of search-based algorithms from simple single-objective local search algorithms to more complex multi-objective population based algorithms.<br></div>