Search-based Stress-test Framework for IC Testing

2020-02-11T09:08:59Z (GMT) by Basil Eljuse
This is a test framework that implements search-based software test approach for auto generating tests that stress-testing deeply embedded components like Arm CCI (Cache Coherent Interconnect) in an Integrated Circuit.

This test framework is used as part of the research which investigates the suitability of search-based approaches in IC testing.

This test framework is used as part of empirical studies conducted using Arm hardware platforms that includes CCI component. It employs search algorithms to derive the test cases that would maximally stress test the CCI component from system level. These empirical studies explored the suitability of a range of search-based algorithms from simple single-objective local search algorithms to more complex multi-objective population based algorithms.