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In Situ Environmental Scanning Electron Microscopy (ESEM) of Semi-Solid Samples

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conference contribution
posted on 05.11.2010, 11:32 by A. J. Smith, Helen V. Atkinson, S. V. Hainsworth, Hongbiao Dong, R. Haghayeghi
The ESEM (Environmental Scanning Electron Microscope) is an instrument that circumvents a limitation of conventional SEM, in that samples can be examined in a gaseous atmosphere rather than a vacuum. With a heating stage, dynamic processes can be observed in situ at high temperature. In this study, A201 aluminium alloy samples with globular structures have been examined in the semisolid region. In addition, a manipulator has been installed onto the heating stage to allow the probing of semi-solid surfaces. The paper shows the potential for manipulating semi-solid materials in order to better understand thixotropic phenomena.

History

Citation

Solid State Phenomena, 2006, 116-117, pp. 700-703

Published in

Solid State Phenomena

Publisher

Trans Tech Publications

issn

1662-9779

Copyright date

2006

Available date

05/11/2010

Publisher version

http://www.scientific.net/SSP.116-117.700

Language

en