Influence_of_semicon_shields_on_the_dielectric_loss_of_XLPE_cables_-_Tong_Liu[1].pdf (462.02 kB)
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Influence of Semicon Shields on the Dielectric Loss of XLPE Cables

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conference contribution
posted on 24.01.2012, 16:16 by Tong Liu, John C. Fothergill, Stephen J. Dodd, Ulf Nilsson
Dielectric response measurement techniques in both time and frequency domains are studied in order to measure the dielectric loss of XLPE cables, which have very low losses. A high sensitivity transformer ratio bridge system, which can measure loss tangents as low as 10-5, has been developed with the ability to measure these cables. A tuned amplifier was designed to help to extend the frequency range from 200Hz to 20kHz. Different model cables from Borealis AB with different semiconducting materials have been measured in the temperature range 15⁰C to 120⁰C. It is found that the semiconducting layers dominate the dielectric loss in the insulation system of the XLPE cables, when the outer semicon is treated as measuring electrode. In this case, steadily increasing dielectric loss has been measured at higher frequencies. The resistivity of the semiconducting materials was measured, which confirmed that the increasing slope is due to the semiconducting layers. After using conductive tapes to wrap the cable samples, monotonically decreasing losses were measured, corresponding to the actual dielectric frequency response of the XLPE cables. It is concluded that the axial resistance of semiconducting shields have a substantial influence on the dielectric loss of XLPE cables, especially for dielectric response in high frequency range. A device on measuring the loss of such cables is presented.

History

Citation

IEEE Conference on Electrical Insulation and Dielectric Phenomena, 2009, Proceedings of, pp. 246-249

Author affiliation

/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Engineering

Version

AM (Accepted Manuscript)

Published in

IEEE Conference on Electrical Insulation and Dielectric Phenomena

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

issn

0084-9162

isbn

978-1-4244-4557-8;978-1-4244-4559-2

Copyright date

2009

Available date

24/01/2012

Publisher version

http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5377792

Language

en