paper1_A4_format.pdf (821.86 kB)
Download file

Influence of the Temperature on the Dielectric Properties of Epoxy Resins

Download (821.86 kB)
conference contribution
posted on 14.03.2012, 15:54 by Stephen J. Dodd, Nikola M. Chalashkanov, John C. Fothergill, Len A. Dissado
Electrical degradation processes in epoxy resins, such as electrical treeing, were found to be dependent on the temperature at which the experiments were carried out. Therefore, it is of considerable research interest to study the influence of temperature on the dielectric properties of the polymers and to relate the effect of temperature on these properties to the possible electrical degradation mechanisms. In this work, the dielectric properties of two different epoxy resin systems have been characterized via dielectric spectroscopy. The epoxy resins used were bisphenol-A epoxy resins Araldite CY1301 and Araldite CY1311, the later being a modified version of the former with added plasticizer. The CY1301 samples were tested below and above their glass transition temperature, while the CY1311 were tested well above it. Both epoxy systems possess similar behaviour above the glass transition temperature, e.g. in a flexible state, which can be characterized as a low frequency dispersion (LFD). On the other hand, it was found that below the glass transition temperature CY1301 samples have almost “flat” dielectric response in the frequency range considered. The influence of possible interfacial features on the measured results is discussed.

History

Citation

Solid Dielectrics (ICSD), 2010, 10th IEEE International Conference on, Proceedings of, pp. 1-4.

Author affiliation

/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Engineering

Source

International Conference on Solid Dielectrics ICSD, University of Potsdam, Potsdam, Germany, 4-9 July 2010.

Version

AM (Accepted Manuscript)

Published in

Solid Dielectrics (ICSD)

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

issn

1553-5282

isbn

978-1-4244-7944-3

Copyright date

2010

Available date

14/03/2012

Publisher version

http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5567945&tag=1

Temporal coverage: start date

04/07/2010

Temporal coverage: end date

09/07/2010

Language

en