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Evaluation of XRI-UNO CdTe detector for nuclear medical imaging

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journal contribution
posted on 03.09.2015, 11:07 by Layal K. Jambi, John Ernest Lees, S. L. Bugby, S. Tipper, M. S. Alqahtani, A. C. Perkins
Over the last two decades advances in semiconductor detector technology have reached the point where they are sufficiently sensitive to become an alternative to scintillators for high energy gamma ray detection for application in fields such as medical imaging. This paper assessed the Cadmium-Telluride (CdTe) XRI-UNO semiconductor detector produced by X-RAY Imatek for photon energies of interest in nuclear imaging. The XRI-UNO detector was found to have an intrinsic spatial resolution of <0.5mm and a high incident count rate capability up to at least 1680cps. The system spatial resolution, uniformity and sensitivity characteristics are also reported.

History

Citation

Journal of Instrumentation, 2015, 10, pp. ?-? (15)

Author affiliation

/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Physics and Astronomy

Version

VoR (Version of Record)

Published in

Journal of Instrumentation

Publisher

IOP PUBLISHING LTD

eissn

1748-0221

Acceptance date

27/05/2015

Copyright date

2015

Available date

03/09/2015

Publisher version

http://iopscience.iop.org/article/10.1088/1748-0221/10/06/P06012/

Language

en