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Silicon Σ13 501 grain boundary interface structure determined by bicrystal Bragg rod x-ray scattering

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journal contribution
posted on 17.06.2013, 09:11 by Paul Bedford Howes, S. Rhead, Mervyn Roy, C.L. Nicklin, J.L. Rawle, C.A. Norris
The atomic structure of the silicon Σ13(501) symmetric tilt grain boundary interface has been determined using Bragg rod x-ray scattering. In contrast to conventional structural studies of grain boundary structure using transmission electron microscopy this approach allows the non-destructive measurement of macroscopic samples. The interface was found to have a single structure that is fully four-fold coordinated. X-ray diffraction data were measured at Beamline I07 at the Diamond Light Source.

History

Citation

Acta Materialia, in press

Author affiliation

/Organisation/COLLEGE OF SCIENCE AND ENGINEERING/Department of Physics and Astronomy

Version

AM (Accepted Manuscript)

Published in

Acta Materialia

Publisher

Elsevier Ltd

issn

1359-6454

Copyright date

2013

Available date

05/07/2015

Publisher version

http://www.sciencedirect.com/science/journal/13596454

Notes

The file associated with this record is embargoed until 24 months after the date of publication. The final published version may be available through the links above.

Language

en

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